A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Both practical and theoretical issues are covered. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements.
All chapters were updated and revised for clarity. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.
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